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P470 - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany

P470 – hRIXS-Spectrometer SCS European XFEL

Application

Resonant inelastic X-ray scattering (RIXS) spectrometer

Year of delivery

2020

Installation site

SCS instrument of the European XFEL, Germany

For  detailed information on the hRIXS  spherical grating monochromator and its performance, see P470-SGM.

Design Features

  • Spectral range: 150 – 2000 eV.
  • Variable included angle monochromator design.

  • Constant detector incidence angles for all grating included angles.

  • Variable entrance and exit arm lengths.

Performance Features

  • Very high pitch angle resolution over the whole range.
  • Low parasitic motions for all resolution relevant axes.
  • Very high vibrational and drift stability.

Outer Dimensions

P470 - Outer dimensions - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany

Technical specifications and performance values

General

Spectrometer rotation

Range

35° to 115°

Resolution

0.001188 °/step (full step)
2.52 x 10-6  °/count

Circle of confusion

118 µm

Vertical deviation

48 µm

Grating chamber

Longitudinal translation

Range

889 mm to 2503 mm

Resolution (design value)

0.094 µm /motor fine step
(1/16, recommended)
0.05 µm /encoder count

Parasitic yaw

8.75 µrad

Detector chamber

Pitch rotation

Range

1.40° to -15.58°

Resolution (design value)

0.098 µrad /motor fine step
(1/16, recommended)
0.166 µrad /encoder count

Repeatability

4.8 µrad (pitch)

1.7 µrad (yaw)

Long-term stability (3h)

0.16 µrad

Longitudinal translation

Range

3490.4 mm to 5008.3 mm

Resolution

0.094 µm /motor fine step
(1/16, recommended)
0.05 µm /encoder count

Repeatability

0.82 µm (longitudinal position)

Parasitic yaw

42 µrad

Long-term stability (> 2h)

0.03 µm

Vertical translation

Range

-1.77 mm to 800.94 mm

Resolution (design value)

0.234 µm /motor fine step
(1/128, recommended)
0.05 µm /encoder count

Repeatability

0.50 µm (vertical position)

Parasitic roll

12.7 µrad

Long-term stability (> 2h)

0.07 µm

Performance Test Results

Parasitic yaw after grating chamber longitudinal translation
P470 - Parasitc yaw after grating chamber longitudial translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Detector chamber longitudinal position
long-term stability
P470 - Detector chamber longitudinal position stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Detector chamber rotation
long-term stability
P470 - Detector chamber rotation stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Detector chamber vertical position
long-term stability
P470 - Detector chamber vertical position stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Detector chamber pitch deviation after
pitch change
P470 - Pitch deviation after detector chamber rotation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Detector chamber yaw deviation after
pitch change
P470 - Yaw deviation after detector chamber rotation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Detector chamber vertical position deviation after
vertical translation
P470 - Detector chamber vertical position deviation after vertical translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Parasitic roll after detector chamber
vertical translation
P470 - Parasitc yaw after detector chamber vertical translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Detector chamber longitudinal position deviation after longitudinal translation
P470 - Detector chamber longitudinal position deviation after longitudinal translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Parasitic yaw after detector chamber
longitudinal translation
P470 - Parasitc yaw after detector chamber longitudinal translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Height deviation after spectrometer rotation
P470 - Height deviation during spectrometer rotation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Residual gas analysis
P470 - Residual gas analysis - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany
Circle of confusion (spectrometer rotation)
P470 - Circle of confusion for spectrometer rotation - Resonant inelastic X-ray scattering (RIXS) spectrometer at SCS instrument of the European XFEL, Germany

Pictures

Video